IEEE - Institute of Electrical and Electronics Engineers, Inc. - Reliability assessment for electromagnetic relay based on time parameters degradation

2010 11th International Conference on Electronic Packaging Technology & High Density Packaging (ICEPT-HDP)

Author(s): Ye Xuerong ; Yu Qiong ; Zhai Guofu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2010
Conference Location: Xi'an, China, China
Conference Date: 16 August 2010
Page(s): 1,269 - 1,272
ISBN (CD): 978-1-4244-8141-5
ISBN (Electronic): 978-1-4244-8142-2
ISBN (Paper): 978-1-4244-8140-8
DOI: 10.1109/ICEPT.2010.5582785
Regular:

The traditional reliability assessment methods for electromagnetic relay (EMR) are based on censored failure-time data, which provides very little reliability information. Furthermore, this method... View More

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