IEEE - Institute of Electrical and Electronics Engineers, Inc. - Coverage based tool path planning for automated polishing using contact stress theory

2010 IEEE International Conference on Automation Science and Engineering (CASE 2010)

Author(s): Rososhansky, M. ; Fengfeng Xi ; Yuwen Li
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2010
Conference Location: Toronto, ON, Canada, Canada
Conference Date: 21 August 2010
Page(s): 592 - 597
ISBN (CD): 978-1-4244-5448-8
ISBN (Electronic): 978-1-4244-5449-5
ISBN (Paper): 978-1-4244-5447-1
DOI: 10.1109/COASE.2010.5584653
Regular:

Presented in this paper is a method for tool path planning for automated polishing. This work is an integral part of the research program on automated polishing and deburring being carried out at... View More

Advertisement