IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Quality Framework to check the applicability of engineering and statistical assumptions for automated gauges

2010 IEEE International Conference on Automation Science and Engineering (CASE 2010)

Author(s): Bering, T.P.K. ; Veldhuis, S.C.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2010
Conference Location: Toronto, ON, Canada, Canada
Conference Date: 21 August 2010
Page(s): 319 - 325
ISBN (CD): 978-1-4244-5448-8
ISBN (Electronic): 978-1-4244-5449-5
ISBN (Paper): 978-1-4244-5447-1
DOI: 10.1109/COASE.2010.5584605
Regular:

In high-volume part manufacturing, interactions between program data and program flow can depart significantly from the initial statistical assumptions used during software development. This is a... View More

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