IEEE - Institute of Electrical and Electronics Engineers, Inc. - Residual life prediction for systems subject to condition monitoring

2010 IEEE International Conference on Automation Science and Engineering (CASE 2010)

Author(s): Rui Jiang ; Kim, M.J. ; Makis, V.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2010
Conference Location: Toronto, ON, Canada, Canada
Conference Date: 21 August 2010
Page(s): 106 - 111
ISBN (CD): 978-1-4244-5448-8
ISBN (Electronic): 978-1-4244-5449-5
ISBN (Paper): 978-1-4244-5447-1
DOI: 10.1109/COASE.2010.5584039
Regular:

This paper presents a parameter estimation and residual life prediction method for a system subject to condition monitoring. We suppose the deterioration process of a system is evolving according... View More

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