IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analysis and evaluation of innovation efficiency in the national hi-tech zone based on DEA

2010 International Conference on Machine Learning and Cybernetics (ICMLC)

Author(s): Wei-Li Shi ; Qing-Shu Kong ; Chuan Sun
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2010
Conference Location: Qingdao, China, China
Conference Date: 11 July 2010
Volume: 3
Page(s): 1,332 - 1,337
ISBN (CD): 978-1-4244-6525-5
ISBN (Electronic): 978-1-4244-6527-9
ISBN (Paper): 978-1-4244-6526-2
DOI: 10.1109/ICMLC.2010.5580873
Regular:

Innovation is the most important task for the national high-tech zone; it's also the most important mission who is given by the country. In this paper, 12 typical samples were selected in 56... View More

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