IEEE - Institute of Electrical and Electronics Engineers, Inc. - The improved localized generalization error model and its applications to feature selection for RBFNN

2010 International Conference on Machine Learning and Cybernetics (ICMLC)

Author(s): Yan-Jun Cui ; Jie Li ; Yan-Dong Ma
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2010
Conference Location: Qingdao, China, China
Conference Date: 11 July 2010
Volume: 3
Page(s): 1,515 - 1,518
ISBN (CD): 978-1-4244-6525-5
ISBN (Electronic): 978-1-4244-6527-9
ISBN (Paper): 978-1-4244-6526-2
DOI: 10.1109/ICMLC.2010.5580829
Regular:

In pattern classification problems, the generalization error caused more and more attentions because of its importance for classifier's training. Wing W.Y. NG [1] et al. proposed localized... View More

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