IEEE - Institute of Electrical and Electronics Engineers, Inc. - Empirical comparison of forward and backward search strategies in L-GEM based feature selection with RBFNN

2010 International Conference on Machine Learning and Cybernetics (ICMLC)

Author(s): Yao-Hong Chan ; Ng, W.W.Y. ; Yeung, D.S. ; Chan, P.P.K.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2010
Conference Location: Qingdao, China, China
Conference Date: 11 July 2010
Volume: 3
Page(s): 1,524 - 1,527
ISBN (CD): 978-1-4244-6525-5
ISBN (Electronic): 978-1-4244-6527-9
ISBN (Paper): 978-1-4244-6526-2
DOI: 10.1109/ICMLC.2010.5580821
Regular:

Feature selection is one of important steps in pattern classification. Without a set of good features, one can not construct an efficient pattern classifier. Therefore, in addition to a good... View More

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