IEEE - Institute of Electrical and Electronics Engineers, Inc. - X-ray image classification using Random Forests with Local Binary Patterns

2010 International Conference on Machine Learning and Cybernetics (ICMLC)

Author(s): Seong-Hoon Kim ; Ji-Hyun Lee ; Byoungchul Ko ; Jae-Yeal Nam
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2010
Conference Location: Qingdao, China, China
Conference Date: 11 July 2010
Volume: 6
Page(s): 3,190 - 3,194
ISBN (CD): 978-1-4244-6525-5
ISBN (Electronic): 978-1-4244-6527-9
ISBN (Paper): 978-1-4244-6526-2
DOI: 10.1109/ICMLC.2010.5580711
Regular:

This paper presents a novel algorithm for the efficient classification of X-ray images to enhance the accuracy and performance. As for describing the characteristics of X-ray image, new Local... View More

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