IEEE - Institute of Electrical and Electronics Engineers, Inc. - The model of credit risk assessment in power industry base on RS-SVM

2010 International Conference on Machine Learning and Cybernetics (ICMLC)

Author(s): Wei Sun ; Qiu-Shi Du ; Bo Cui
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2010
Conference Location: Qingdao, China, China
Conference Date: 11 July 2010
Volume: 4
Page(s): 2,021 - 2,025
ISBN (CD): 978-1-4244-6525-5
ISBN (Electronic): 978-1-4244-6527-9
ISBN (Paper): 978-1-4244-6526-2
DOI: 10.1109/ICMLC.2010.5580511
Regular:

In this paper, according to the situation of credit risk assessment in power industry, index system of risk assessment was established. Credit risk assessment models based on rough set and support... View More

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