IEEE - Institute of Electrical and Electronics Engineers, Inc. - Trusted measurement model of runtime process behavior based on turing

2010 International Conference on Machine Learning and Cybernetics (ICMLC)

Author(s): Rui-Hua Li ; Zhen-Shan Zhu ; Chen Li ; Min-Hui Jiang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2010
Conference Location: Qingdao, China, China
Conference Date: 11 July 2010
Volume: 4
Page(s): 2,183 - 2,187
ISBN (CD): 978-1-4244-6525-5
ISBN (Electronic): 978-1-4244-6527-9
ISBN (Paper): 978-1-4244-6526-2
DOI: 10.1109/ICMLC.2010.5580480
Regular:

In this paper, we study the development and status of the current trusted measurement, and analyze the threats of process running in today's structure of the computer system. From the view of... View More

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