IEEE - Institute of Electrical and Electronics Engineers, Inc. - A study on cluster validity using intelligent evolutionary K-means approach

2010 International Conference on Machine Learning and Cybernetics (ICMLC)

Author(s): Ming-Hseng Tseng ; Chang-Yun Chiang ; Ping-Hung Tang ; Hui-Ching Wu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2010
Conference Location: Qingdao, China, China
Conference Date: 11 July 2010
Volume: 5
Page(s): 2,510 - 2,515
ISBN (CD): 978-1-4244-6525-5
ISBN (Electronic): 978-1-4244-6527-9
ISBN (Paper): 978-1-4244-6526-2
DOI: 10.1109/ICMLC.2010.5580825
Regular:

The K-means clustering is commonly used in applications of unsupervised classification and the related area due to its simplicity and effectiveness. In this study, an intelligent evolutionary... View More

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