IEEE - Institute of Electrical and Electronics Engineers, Inc. - A new method to evaluate students' learning achievement by automatically generating the importance degrees of attributes of questions

2010 International Conference on Machine Learning and Cybernetics (ICMLC)

Author(s): Shyi-Ming Chen ; Ting-Kuei Li
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2010
Conference Location: Qingdao, China, China
Conference Date: 11 July 2010
Volume: 5
Page(s): 2,495 - 2,499
ISBN (CD): 978-1-4244-6525-5
ISBN (Electronic): 978-1-4244-6527-9
ISBN (Paper): 978-1-4244-6526-2
DOI: 10.1109/ICMLC.2010.5580818
Regular:

This paper presents a new method for students' learning achievement evaluation by automatically generating the importance degrees of the attributes of questions. It considers the "accuracy rate",... View More

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