IEEE - Institute of Electrical and Electronics Engineers, Inc. - Advanced antenna diagnostics and pattern processing form measured data

2010 International Workshop on Electromagnetics; Applications and Student Innovation (iWEM)

Author(s): Quijano, J.L.A. ; Vecchi, G. ; Foged, L.J. ; Chauvet, F.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2010
Conference Location: Taipei, Taiwan, Taiwan
Conference Date: 11 August 2010
Page(s): 61 - 65
ISBN (CD): 978-1-4244-6417-3
ISBN (Electronic): 978-1-4244-6418-0
ISBN (Paper): 978-1-4244-6416-6
DOI: 10.1109/AEM2C.2010.5578790
Regular:

Introduction We discuss recent advances in antenna diagnostics from measured field data. The method proposed is based on field representation using equivalent magnetic and electric sources on... View More

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