IEEE - Institute of Electrical and Electronics Engineers, Inc. - Optical analysis of haze ratio and antireflection in structured thin film solar cell

2010 International Workshop on Electromagnetics; Applications and Student Innovation (iWEM)

Author(s): Chao, C.C. ; Pan, Y.C. ; Wang, C.M. ; Chang, J.Y.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2010
Conference Location: Taipei, Taiwan, Taiwan
Conference Date: 11 August 2010
Page(s): 56 - 60
ISBN (CD): 978-1-4244-6417-3
ISBN (Electronic): 978-1-4244-6418-0
ISBN (Paper): 978-1-4244-6416-6
DOI: 10.1109/AEM2C.2010.5578788
Regular:

In this paper, the influence of the haze ratio and antireflection properties of the thin film solar cell with a periodic texture is theoretical investigated. Two different cases, Case 1 and Case... View More

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