IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fault Detection Based on Real-Value Negative Selection Algorithm of Artificial Immune System

2010 International Conference on Intelligent Computing and Cognitive Informatics (ICICCI)

Author(s): Xin Yue ; Dongge Wen ; Haifeng Ma ; Jianfei Zhang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2010
Conference Location: Kuala Lumpur, Malaysia, Malaysia
Conference Date: 22 June 2010
Page(s): 243 - 246
ISBN (Electronic): 978-1-4244-6641-2
ISBN (Paper): 978-1-4244-6640-5
DOI: 10.1109/ICICCI.2010.102
Regular:

Applications of Artificial Immune System (AIS) has been widely applied in various engineering, including network security, pattern recognition, combinational optimization, machine learning and... View More

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