IEEE - Institute of Electrical and Electronics Engineers, Inc. - Temperature and Humidity Measuring of a New Development Box Based on Expert PID

2010 International Conference on Intelligent Computing and Cognitive Informatics (ICICCI)

Author(s): Ma Jiwei ; Lin Zhipeng ; Gao Jianli ; Ma Jimei ; Lin Hongju ; Liu Shiguang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2010
Conference Location: Kuala Lumpur, Malaysia, Malaysia
Conference Date: 22 June 2010
Page(s): 432 - 435
ISBN (Electronic): 978-1-4244-6641-2
ISBN (Paper): 978-1-4244-6640-5
DOI: 10.1109/ICICCI.2010.98
Regular:

This paper focuses on the hardware and software design method of a new type of high efficient temperature and humidity testing cabinet. As the hardware core is based on the STC12C5616AD MCU, the... View More

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