IEEE - Institute of Electrical and Electronics Engineers, Inc. - Linear ion trap for second-order Doppler shift reduction in frequency standard applications

Author(s): J.D. Prestage ; G.R. Janik ; G.J. Dick ; L. Maleki
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 1990
Volume: 37
Page Count: 8
Page(s): 535 - 542
ISSN (Paper): 0885-3010
DOI: 10.1109/58.63110
Regular:

The authors have designed and are presently testing a novel linear ion trap that permits storage of a large number of ions with reduced susceptibility to the second-order Doppler effect caused by... View More

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