IEEE - Institute of Electrical and Electronics Engineers, Inc. - A study of applying support vector machine and Genetic Algorithm to software reliability forecasting

2010 International Conference on Electronics and Information Engineering (ICEIE 2010)

Author(s): Jung-Hua Lo
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2010
Conference Location: Kyoto, Japan, Japan
Conference Date: 1 August 2010
Volume: 1
ISBN (Electronic): 978-1-4244-7681-7
ISBN (Paper): 978-1-4244-7679-4
DOI: 10.1109/ICEIE.2010.5559867
Regular:

Software reliability prediction models is very helpful for developers and testers to know the phase in which corrective action need to be performed in order to achieve target reliability estimate.... View More

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