IEEE - Institute of Electrical and Electronics Engineers, Inc. - Neural modeling with automatic structure selection

2010 IEEE International Conference on Information Reuse & Integration (2010 IRI)

Author(s): Xiaoou Li ; Wen Yu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2010
Conference Location: Las Vegas, NV, USA, USA
Conference Date: 4 August 2010
Page(s): 314 - 317
ISBN (CD): 978-1-4244-8098-2
ISBN (Electronic): 978-1-4244-8099-9
ISBN (Paper): 978-1-4244-8097-5
DOI: 10.1109/IRI.2010.5558918
Regular:

This paper focuses on both the structure uncertainty and parameter uncertainty which have been widely explored in the literature of nonlinear system identification. An integrated analytic... View More

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