IEEE - Institute of Electrical and Electronics Engineers, Inc. - Wideband dual polarized probe with interchangeable apertures for advanced antenna measurement applications

2010 IEEE International Symposium Antennas and Propagation and CNC/USNC/URSI Radio Science Meeting

Author(s): Foged, L.J. ; Giacomini, A. ; Morbidini, R. ; Isman, N.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2010
Conference Location: Toronto, ON, Canada, Canada
Conference Date: 11 July 2010
Page(s): 1 - 4
ISBN (CD): 978-1-4244-4968-2
ISBN (Paper): 978-1-4244-4967-5
ISSN (CD): 1522-3965
ISSN (Paper): 1522-3965
DOI: 10.1109/APS.2010.5562162
Regular:

Dual polarized probes for modern high precision measurement systems have strict requirements in terms of pattern shape, polarization purity, return loss and port-to-port isolation. A desired... View More

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