IEEE - Institute of Electrical and Electronics Engineers, Inc. - Context modelling and partial-order reduction: Application to SDL industrial embedded systems

2010 International Symposium on Industrial Embedded Systems (SIES)

Author(s): Dumas, X. ; Boniol, F. ; Dhaussy, P. ; Bonnafous, E.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2010
Conference Location: Trento, Italy, Italy
Conference Date: 7 July 2010
Page(s): 197 - 200
ISBN (Electronic): 978-1-4244-5841-7
ISBN (Paper): 978-1-4244-5839-4
ISBN (Online): 978-1-4244-5840-0
DOI: 10.1109/SIES.2010.5551396
Regular:

In this paper we introduce a method combining system environment description and partial-order reduction for the verification of SDL systems. The aim of this work is to address the problem of the... View More

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