IEEE - Institute of Electrical and Electronics Engineers, Inc. - Automatic generation of a parameter-domain-based functional input coverage model

2010 11th Latin American Test Workshop - LATW

Author(s): Castro, C.I. ; Strum, M. ; Wang Jiang Chau
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2010
Conference Location: Punta del Este, Uruguay, Uruguay
Conference Date: 28 March 2010
Page(s): 1 - 6
ISBN (Electronic): 978-1-4244-7785-2
ISBN (Paper): 978-1-4244-7786-9
DOI: 10.1109/LATW.2010.5550344
Regular:

IP cores, which are usually described in the RT level, must be thoroughly verified so as not to allow design bugs to inadvertently propagate throughout the system. As the mainstream technique,... View More

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