IEEE - Institute of Electrical and Electronics Engineers, Inc. - On Comparing and Complementing two MBT approaches

2010 11th Latin American Test Workshop - LATW

Author(s): Cristia, M. ; Santiago, V. ; Vijaykumar, N.L.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2010
Conference Location: Punta del Este, Uruguay, Uruguay
Conference Date: 28 March 2010
Page(s): 1 - 6
ISBN (Electronic): 978-1-4244-7785-2
ISBN (Paper): 978-1-4244-7786-9
DOI: 10.1109/LATW.2010.5550339
Regular:

At INPE1 researchers and software engineers have been using Statechart-based testing for some time to test on-board satellite software. On the other hand, a group of researchers at... View More

Advertisement