IEEE - Institute of Electrical and Electronics Engineers, Inc. - 1st workshop on fault-tolerance for HPC at extreme scale FTXS 2010

2010 IEEE/IFIP International Conference on Dependable Systems & Networks (DSN)

Author(s): Daly, John ; DeBardeleben, Nathan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2010
Conference Location: Chicago, IL, USA, USA
Conference Date: 28 June 2010
Page(s): 615
ISBN (Electronic): 978-1-4244-7501-8
ISBN (Paper): 978-1-4244-7500-1
ISBN (Online): 978-1-4244-7499-8
DOI: 10.1109/DSN.2010.5544426
Regular:

With the emergence of many-core processors, accelerators, and alternative/heterogeneous architectures, the HPC community faces a new challenge: a scaling in number of processing elements... View More

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