IEEE - Institute of Electrical and Electronics Engineers, Inc. - A case for dynamic risk assessment in NEC systems of systems

2010 5th International Conference on System of Systems Engineering (SoSE)

Author(s): Aitken, J.M. ; Alexander, R. ; Kelly, T.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2010
Conference Location: Loughborough, United Kingdom, United Kingdom
Conference Date: 22 June 2010
Page(s): 1 - 6
ISBN (CD): 978-1-4244-8195-8
ISBN (Electronic): 978-1-4244-8196-5
ISBN (Paper): 978-1-4244-8197-2
DOI: 10.1109/SYSOSE.2010.5544114
Regular:

The level of complexity in Systems of Systems is increasing as more complex functionality emerges from the interaction of individual components. As networks become more complex it becomes more... View More

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