IEEE - Institute of Electrical and Electronics Engineers, Inc. - Metastability of CMOS latch/flip-flop

Author(s): L.-S. Kim ; R.W. Dutton
Sponsor(s): IEEE Solid-State Circuits Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 1990
Volume: 25
Page Count: 10
Page(s): 942 - 951
ISSN (Paper): 0018-9200
ISSN (Online): 1558-173X
DOI: 10.1109/4.58286
Regular:

Optimal device size, aspect ratio, and configurations for the design of the metastable hardened CMOS latch/flip-flops are obtained by using the AC small-signal analysis in the frequency domain... View More

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