IEEE - Institute of Electrical and Electronics Engineers, Inc. - Erosion behavior and 'erodibility' of Ag/CdO and Ag/SnO/sub 2/ contacts under AC 3 and AC 4 test conditions

Author(s): H. Manhart ; W. Rieder
Sponsor(s): IEEE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 1990
Volume: 13
Page Count: 9
Page(s): 56 - 64
ISSN (Paper): 0148-6411
DOI: 10.1109/33.52878
Regular:

Contact erosion depends on both duration and efficiency of interaction between arc and contacts. Arc motion in a magnetic field was recorded and the material loss caused by arc erosion was... View More

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