IEEE - Institute of Electrical and Electronics Engineers, Inc. - Deconstructing ionization and scattering effects in crossed-field diodes

2010 IEEE 37th International Conference on Plasma Sciences (ICOPS)

Author(s): Stutzman, B.S. ; Luginsland, J.W. ; Cartwright, K.L.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2010
Conference Location: Norfolk, VA, USA, USA
Conference Date: 20 June 2010
Page(s): 1
ISBN (Electronic): 978-1-4244-5476-1
ISBN (Paper): 978-1-4244-5474-7
ISBN (Online): 978-1-4244-5475-4
ISSN (Paper): 0730-9244
ISSN (Online): 0730-9244
DOI: 10.1109/PLASMA.2010.5533923
Regular:

The presence of plasma has long been suspected to be a major cause of gap closure in high power crossed-field diodes and HPM sources, even under the condition of magnetic insulation. Previous work... View More

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