IEEE - Institute of Electrical and Electronics Engineers, Inc. - Effects of High Temperature Stress on Transgene Expression and DNA Methylation Pattern

2010 4th International Conference on Bioinformatics and Biomedical Engineering (iCBBE)

Author(s): Fan-suo Zeng ; Ying Xin ; Kun Liu ; Ya-guang Zhan ; Chuan-ping Yang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2010
Conference Location: Chengdu, China, China
Conference Date: 18 June 2010
Page(s): 1 - 4
ISBN (CD): 978-1-4244-4713-8
ISBN (Paper): 978-1-4244-4712-1
ISSN (CD): 2151-7614
ISSN (Electronic): 2151-7622
ISSN (Paper): 2151-7614
DOI: 10.1109/ICBBE.2010.5517794
Regular:

Abstract-Studies about the variation of DNA methylation pattern under high temperature stress (37˚C) contribute to a comprehensive understanding of the apparent regulation of biological... View More

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