IEEE - Institute of Electrical and Electronics Engineers, Inc. - Accurate Image Registration Using SIFT for Extended-Field-of-View Sonography

2010 4th International Conference on Bioinformatics and Biomedical Engineering (iCBBE)

Author(s): Liya Kong ; Qinghua Huang ; Minhua Lu ; Shuohe Zheng ; Lianwen Jin ; Siping Chen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2010
Conference Location: Chengdu, China, China
Conference Date: 18 June 2010
Page(s): 1 - 4
ISBN (CD): 978-1-4244-4713-8
ISBN (Paper): 978-1-4244-4712-1
ISSN (CD): 2151-7614
ISSN (Electronic): 2151-7622
ISSN (Paper): 2151-7614
DOI: 10.1109/ICBBE.2010.5517503
Regular:

Extended-field-of-view (EFOV) sonography has been proven to be capable of illustrating panoramic ultrasound images. In EFOV technology, accurate registration of original images is the... View More

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