IEEE - Institute of Electrical and Electronics Engineers, Inc. - Research on the Symptoms and the Critical Value of Nickel Toxicity of Maize

2010 4th International Conference on Bioinformatics and Biomedical Engineering (iCBBE)

Author(s): Zhou Mi-ping ; Liu Jin-hua ; Wang Ya-qing ; Yang Jing-min ; Yu Xiao-bin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2010
Conference Location: Chengdu, China, China
Conference Date: 18 June 2010
Page(s): 1 - 6
ISBN (CD): 978-1-4244-4713-8
ISBN (Paper): 978-1-4244-4712-1
ISSN (CD): 2151-7614
ISSN (Electronic): 2151-7622
ISSN (Paper): 2151-7614
DOI: 10.1109/ICBBE.2010.5517400
Regular:

Nickel (Ni) plays an important role in the growth of plants, but it is also a kind of heavy metal which can easily enrich in soil and exert toxic effect on plants. To evaluate the Ni stress on the... View More

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