IEEE - Institute of Electrical and Electronics Engineers, Inc. - Noise measurements in two-beam interferometers excited by semiconductor lasers with non-Lorentzian line shapes

Author(s): A. Arie ; M. Tur
Sponsor(s): IEEE Lasers and Electro-Optics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 1990
Volume: 26
Page Count: 7
Page(s): 1,999 - 2,005
ISSN (Paper): 0018-9197
ISSN (Online): 1558-1713
DOI: 10.1109/3.62119
Regular:

An experimental study of phase-induced intensity noise is presented for the case of a Mach-Zehnder interferometer driven by a non-Lorentzian line shape semiconductor laser. The important scales of... View More

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