IEEE - Institute of Electrical and Electronics Engineers, Inc. - Design techniques for soft-error mitigation

2010 IEEE International Conference on IC Design & Technology (ICICDT)

Author(s): Nicolaidis, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2010
Conference Location: Grenoble, France, France
Conference Date: 2 June 2010
Page(s): 208 - 214
ISBN (CD): 978-1-4244-5774-8
ISBN (Electronic): 978-1-4244-5775-5
ISBN (Paper): 978-1-4244-5773-1
DOI: 10.1109/ICICDT.2010.5510252
Regular:

In nanometric technologies, circuits are increasingly sensitive to various kinds of perturbations. Soft-errors, a concern in the past for space applications, became a reliability issue at... View More

Advertisement