IEEE - Institute of Electrical and Electronics Engineers, Inc. - Study on formation of thin cylinder diffraction pattern

2010 International Conference on Information and Automation (ICIA)

Author(s): Cui Jianwen ; Fu Bin ; You Jiang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2010
Conference Location: Harbin, China, China
Conference Date: 20 June 2010
Page(s): 1,752 - 1,756
ISBN (CD): 978-1-4244-5702-1
ISBN (Electronic): 978-1-4244-5704-5
ISBN (Paper): 978-1-4244-5701-4
DOI: 10.1109/ICINFA.2010.5512215
Regular:

To improve the measurement accuracy of thin cylinder diameter by laser diffraction, the formation of actual diffraction pattern of thin cylinder is studied systematicly. The difference between... View More

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