IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fast antenna testing using advanced probe array technology

2010 4th European Conference on Antennas and Propagation (EuCAP)

Author(s): Durand, L. ; Duchesne, L. ; Foged, L.J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2010
Conference Location: Barcelona, Spain, Spain
Conference Date: 12 April 2010
Page(s): 1 - 4
ISBN (Paper): 978-1-4244-6431-9
ISBN (Online): 978-84-7653-472-4
Regular:

The use of probe array is a well established technology for spherical near field systems offering all the possibilities and accuracies of traditional single probe testing at a much faster speed... View More

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