IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analysis on the refraction stealth characteristic of cylinder plasma envelopes

2010 International Conference on Microwave and Millimeter Wave Technology (ICMMT)

Author(s): Lai-xuan Ma ; Hou Zhang ; Li Zhu ; Xiang-jun Gao
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2010
Conference Location: Chengdu, China, China
Conference Date: 8 May 2010
Page(s): 1,695 - 1,698
ISBN (CD): 978-1-4244-5706-9
ISBN (Electronic): 978-1-4244-5708-3
ISBN (Paper): 978-1-4244-5705-2
DOI: 10.1109/ICMMT.2010.5524793
Regular:

The refraction stealth characteristic of two dimensional cylinder plasma envelopes is studied. Firstly, an electromagnetic (EM) problem model of EM-wave propagating through cylinder plasma... View More

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