IEEE - Institute of Electrical and Electronics Engineers, Inc. - P2-2: Tape-helix analysis of conductivity losses in a metal segment loaded helical SWS

2010 IEEE International Vacuum Electronics Conference (IVEC)

Author(s): Pamisetty, R.R.R. ; Datta, S.K. ; Deshmukh, V.A. ; Kumar, L.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2010
Conference Location: Monterey, CA, USA, USA
Conference Date: 18 May 2010
Page(s): 225 - 226
ISBN (CD): 978-1-4244-7097-6
ISBN (Electronic): 978-1-4244-7099-0
ISBN (Paper): 978-1-4244-7098-3
DOI: 10.1109/IVELEC.2010.5503522
Regular:

Electromagnetic field analysis of a helical slow-wave structure was carried out following tape-helix model incorporating the effects of space-harmonic propagating modes and the effects of finite... View More

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