IEEE - Institute of Electrical and Electronics Engineers, Inc. - P4-18: Cold testing platform for Electromagnetic Band Gap waveguide

2010 IEEE International Vacuum Electronics Conference (IVEC)

Author(s): Ningfeng Bai ; Hehong Fan ; Xingqun Zhao ; Fujiang Liao ; Jinjun Feng ; Xiaohan Sun
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2010
Conference Location: Monterey, CA, USA, USA
Conference Date: 18 May 2010
Page(s): 481 - 482
ISBN (CD): 978-1-4244-7097-6
ISBN (Electronic): 978-1-4244-7099-0
ISBN (Paper): 978-1-4244-7098-3
DOI: 10.1109/IVELEC.2010.5503467
Regular:

A high space resolution platform has been built to measure the cold test parameters of Electromagnetic Band Gap (EBG) waveguide. The space resolution of this platform can be reached to 4µm and... View More

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