IEEE - Institute of Electrical and Electronics Engineers, Inc. - Semi-formal functional verification by EFSM traversing via NuSMV

2010 IEEE International High Level Design Validation and Test Workshop (HLDVT)

Author(s): Di Guglielmo, G. ; Fummi, F. ; Pravadelli, G. ; Soffia, S. ; Roveri, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2010
Conference Location: Anaheim, FL, USA, USA
Conference Date: 10 June 2010
Page(s): 58 - 65
ISBN (CD): 978-1-4244-7804-0
ISBN (Electronic): 978-1-4244-7806-4
ISBN (Paper): 978-1-4244-7805-7
ISSN (CD): 1552-6674
ISSN (Paper): 1552-6674
DOI: 10.1109/HLDVT.2010.5496660
Regular:

Simulation-based verification of hardware systems is well-established in industrial practice thanks to the ease-of-use of the approach and to its scalability. However, it notoriously suffers from... View More

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