IEEE - Institute of Electrical and Electronics Engineers, Inc. - Frequency and severity of deviations during simultaneous independent approaches to parallel runways

2010 Integrated Communications, Navigation and Surveillance Conference (ICNS)

Author(s): Massimini, S.V. ; McNeil, G.C. ; Tene, N.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2010
Conference Location: Herndon, VA, USA, USA
Conference Date: 11 May 2010
Page(s): 1 - 24
ISBN (CD): 978-1-4244-7458-5
ISBN (Electronic): 978-1-4244-7459-2
ISBN (Paper): 978-1-4244-7457-8
ISSN (CD): 2155-4943
ISSN (Electronic): 2155-4951
ISSN (Paper): 2155-4943
DOI: 10.1109/ICNSURV.2010.5503313
Regular:

• Current simultaneous approach standards were achieved over a period beginning in approximately 1965 - Standards reflect varying levels of assumptions that were often accepted by consensus,... View More

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