IEEE - Institute of Electrical and Electronics Engineers, Inc. - Incident beam shape effects on thick-film laser induced forward transfer

2010 Conference on Lasers and Electro-Optics (CLEO)

Author(s): Nicholas Kattamis ; Matthew Brown ; Craig B Arnold
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2010
Conference Location: San Jose, CA, USA
Conference Date: 16 May 2010
Page(s): 1 - 2
ISBN (CD): 978-1-55752-890-2
DOI: 10.1364/CLEO.2010.JTuA5
Regular:

We use finite element modeling to investigate the effects of incident beam shape on stress and temperature evolution in the dynamic release layer during thick-film laser-induced forward transfer.... View More

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