IEEE - Institute of Electrical and Electronics Engineers, Inc. - Field perturbations due to strong coupling and modal confinement in SOI arrayed waveguides

2010 Conference on Lasers and Electro-Optics (CLEO)

Author(s): Michael L Cooper ; Shayan Mookherjea
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2010
Conference Location: San Jose, CA, USA
Conference Date: 16 May 2010
Page(s): 1 - 2
ISBN (CD): 978-1-55752-890-2
DOI: 10.1364/CLEO.2010.JThE70
Regular:

We present a method of rescaling the basis set used in coupled mode theory for constructing the mode profiles of silicon-on-insulator strongly coupled arrayed waveguides. We show that due... View More

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