IEEE - Institute of Electrical and Electronics Engineers, Inc. - Quantum process tomography by direct characterization of quantum dynamics using hyperentangled photons

2010 Conference on Lasers and Electro-Optics (CLEO)

Author(s): Trent Graham ; Julio Barreiro ; Paul G Kwiat
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2010
Conference Location: San Jose, CA, USA
Conference Date: 16 May 2010
Page(s): 1 - 2
ISBN (CD): 978-1-55752-890-2
DOI: 10.1364/CLEO.2010.JThC2
Regular:

We present the first experimental results using photons entangled in multiple degrees of freedom to efficiently characterize various preserving single-photon processes by Direct Characterization... View More

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