IEEE - Institute of Electrical and Electronics Engineers, Inc. - Optimization model to research assess the impact of quality and cost indicators of product life cycle

2010 VI-th International Conference on Perspective Technologies and Methods in MEMS Design (MEMSTECH)

Author(s): Tkachenko, N. ; Fedorchuk, E.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2010
Conference Location: Lviv, Ukraine, Ukraine
Conference Date: 20 April 2010
Page(s): 85 - 86
ISBN (Electronic): 978-966-2191-11-0
ISBN (Paper): 978-1-4244-7325-0
Regular:

Analyzed and evaluated the impact of quality and value indexes the result of the life cycle of the product. Formalized the optimization procedures of quality / value parameters of model structure... View More

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