IEEE - Institute of Electrical and Electronics Engineers, Inc. - Statistical Resolution Limit for multiple parameters of interest and for multiple signals

ICASSP 2010 - 2010 IEEE International Conference on Acoustics, Speech and Signal Processing

Author(s): El Korso, M.N. ; Boyer, R. ; Renaux, A. ; Marcos, S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2010
Conference Location: Dallas, TX, USA, USA
Conference Date: 14 March 2010
Page(s): 3,602 - 3,605
ISBN (CD): 978-1-4244-4296-6
ISBN (Paper): 978-1-4244-4295-9
ISSN (CD): 1520-6149
ISSN (Paper): 1520-6149
DOI: 10.1109/ICASSP.2010.5495922
Regular:

The concept of Statistical Resolution Limit (SRL), which is defined as the minimal separation to resolve two closely spaced signals, is an important tool to quantify performance in parametric... View More

Advertisement