IEEE - Institute of Electrical and Electronics Engineers, Inc. - Magnetostriction and in-situ measurement of stress of Co/Pd compositionally modulated multilayer films during fabrication

Author(s): H. Awano ; Y. Suzuki ; T. Yamazaki ; T. Katayama ; A. Itoh
Sponsor(s): IEEE Magnetics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 1990
Volume: 26
Page Count: 3
Page(s): 2,742 - 2,744
ISSN (Paper): 0018-9464
ISSN (Online): 1941-0069
DOI: 10.1109/20.104857
Regular:

The internal stress ( sigma /sub int/) at the interface of each layer of Co(8 AA)/Pd (40 AA) compositionally modulated multilayer film (CMF) was successfully measured with the aim of evaluating... View More

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