IEEE - Institute of Electrical and Electronics Engineers, Inc. - Self-Adaptive mechanism for cache memory reliability improvement

2010 IEEE 13th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)

Author(s): Liviu Agnola ; Mircea Vlăduţiu ; Mihai Udrescu
Sponsor(s): IEEE Computer Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2010
Conference Location: Vienna, Austria
Conference Date: 14 April 2010
Page(s): 117 - 118
ISBN (CD): 978-1-4244-6611-5
ISBN (Electronic): 978-1-4244-6613-9
ISBN (Paper): 978-1-4244-6612-2
DOI: 10.1109/DDECS.2010.5491807
Regular:

This paper proposes a graceful degradation method applied to k-way set associative cache memories. The method is called "Self Adaptive cache Memories" (SAM); it works by removing the faulty... View More

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