IEEE - Institute of Electrical and Electronics Engineers, Inc. - Measurements of the wear of a thin film disk

Author(s): P.B.P. Phipps
Sponsor(s): IEEE Magnetics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 1990
Volume: 26
Page Count: 3
Page(s): 2,496 - 2,498
ISSN (Paper): 0018-9464
ISSN (Online): 1941-0069
DOI: 10.1109/20.104775
Regular:

A test designed to simulate worst-case start-stop contacts is described. It combines controlled contact stresses with well-defined flying. Magnetic readback and optical methods are used to... View More

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