IEEE - Institute of Electrical and Electronics Engineers, Inc. - Predicting crack initiation and propagation using XFEM, CZM and peridynamics: A comparative study

2010 IEEE 60th Electronic Components and Technology Conference (ECTC 2010)

Author(s): Agwai, A. ; Guven, I. ; Madenci, E.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2010
Conference Location: Las Vegas, NV, USA, USA
Conference Date: 1 June 2010
Page(s): 1,178 - 1,185
ISBN (Electronic): 978-1-4244-6412-8
ISBN (Paper): 978-1-4244-6410-4
ISBN (Online): 978-1-4244-6411-1
ISSN (Paper): 0569-5503
ISSN (Online): 0569-5503
DOI: 10.1109/ECTC.2010.5490851
Regular:

This study presents a comparison of extended finite elements (XFEM), cohesive zone model (CZM) and the peridynamic theory (PD). By comparisons against two experimental benchmark studies, the... View More

Advertisement