IEEE - Institute of Electrical and Electronics Engineers, Inc. - Correlations of capacitance-voltage hysteresis with thin-film CdTe Solar cell performance during accelerated lifetime testing

2010 IEEE International Reliability Physics Symposium (IRPS)

Author(s): Albin, D.S. ; del Cueto, J.A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2010
Conference Location: Garden Grove (Anaheim), CA, USA, USA
Conference Date: 2 May 2010
Page(s): 318 - 322
ISBN (CD): 978-1-4244-5431-0
ISBN (Electronic): 978-1-4244-5429-7
ISBN (Paper): 978-1-4244-5430-3
ISSN (CD): 1541-7026
ISSN (Electronic): 1938-1891
ISSN (Paper): 1541-7026
DOI: 10.1109/IRPS.2010.5488811
Regular:

In this paper we present the correlation of CdTe solar cell performance with capacitance-voltage hysteresis, defined presently as the difference in capacitance measured at zero-volt bias when... View More

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